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https://ri.ufs.br/jspui/handle/riufs/21543| Document Type: | Trabalhos em Eventos |
| Title: | Defect studies and optical activation of Yb doped GaN |
| Authors: | Lorenz, K. Alves, E. Magalhães, S. Peres, M. Monteiro, T. Kozanecki, A. Valerio, Mario Ernesto Giroldo |
| Issue Date: | 2010 |
| Resumo : | Wide band-gap semiconductors, particularly III-nitrides, became one of the most studied materials during the last decades. These compounds are the base of a new generation of optoelectronic devices operating in the UV-Blue region of the electromagnetic spectrum. Incorporation of rare-earth (RE) ions into nitrides creates new routes to build all-nitride electroluminescent devices, using the sharp intra-4f n transitions of these elements. The introduction of the RE ions in the nitride lattice during the growth or by ion implantation creates defects which influence the optical behaviour of the doped region. In this work we report the results on Yb implanted GaN. A combination of techniques (Rutherford backscattering/Channeling and Photoluminescence) was used to assess the mechanisms responsible for the optical and structural behaviour of the doped materials. Lattice site location experiments showed that Yb is incorporated into positions slightly displaced from the Ga-site. Clearly the optical activity of the RE could be enhanced by orders of magnitude reducing the number of non-radiative recombination paths related with defects. |
| Keywords: | Gallium nitride (GaN) Wide band-gap semiconductors |
| ISSN: | 1742-6596 1742-6588 |
| Is part of: | Journal of Physics: Conference Series |
| Language: | eng |
| Publisher / Institution : | IOP Publishing |
| Citation: | LORENZ, K. et al. Defect studies and optical activation of Yb doped GaN. Journal of Physics: Conference Series, v. 249, 2010. Trabalho apresentado em 16º International Conference on Defects in Insulating Materials, 2008, [Aracaju]. Disponível em: https://iopscience.iop.org/article/10.1088/1742-6596/249/1/012053/pdf. Acesso em: 3 abr. 2025. |
| License: | Creative Commons Atribuição 4.0 Internacional (CC BY 4.0) |
| URI: | https://ri.ufs.br/jspui/handle/riufs/21543 |
| Appears in Collections: | DFI - Artigos de periódicos DFI - Trabalhos apresentados em eventos |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| DefectStudiesGaN.pdf | 463,52 kB | Adobe PDF |  View/Open |
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